Atomic force microscope LAFM-A10 comes with combined design of scan head and sample stage so as to give strong anti-vibration performance. It’s equipped with precision laser detection and probe alignment device for simple & easy adjustment of laser beam.
CatalogSpecifications
Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
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Scan angle | Random angle |
Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
Sample size | Ø≤ 90 mm, H≤ 20 mm |
Sample movement | 0 to 20 mm |
Pulse width of approaching motor | 10 ± 2 ms |
Scan rate | 0.6 Hz to 4.34 Hz |
Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
Types of sampling pixel | 256×256, 512×512 |
Feedback type | DSP digital feedback |
Feedback sampling rate | 64 KHz |
PC connections: | USB 2.0 |
Windows software | Compatible with windows 98/2000/XP/7/8 |
Instrument Diemnsion | 415 × 410 × 545 mm |
Net weight | 40 kg |
Gross Weight | 50 kg |
Features
Software Features
2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image
Applications
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.